Materials Science
Get the most out of your samples with DECTRIS’ radiation-hard, hybrid-pixel electron detectors.
Electron Microscopy (EM) provides insight at all scales and modalities of Materials Science research: from discovering new materials and understanding their physical and chemical properties to innovating advanced processes and conducting product quality control. With DECTRIS’ hybrid-pixel direct electron detectors, you will collect more information from your sample—faster and without any fuss.
- ✓ Accurate: this technology offers single-electron counting and noise-free detection.
- ✓ Fast: our detectors significantly reduce experiment time and increase instrument throughput.
- ✓ Easy: our detectors integrate straightforwardly into any modern data pipeline or electron microscopy suite.
- ✓ Reliable: a dedicated team of DECTRIS field engineers will help you during integration and throughout the product’s life cycle.
Detectors
ARINA
Even at a frame rate of 120 kHz, this ultra-fast 4D STEM detector does not compromise on dynamic range or sensitivity.
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QUADRO
With its continuous readout and noise-free acquisition, DECTRIS QUADRO® detector brings microED and electron imaging techniques to a new level.
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ELA
Fast, sensitive, and radiation-hard, DECTRIS ELA® electron-counting detector offers unmatched performance in EELS and 4D STEM.
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ELA | ARINA | QUADRO | |
|---|---|---|---|
Number of pixels (W x H) | 1,028 x 512 | 192 x 192 | 512 x 512 |
Pixel size (W x H) [µm²] | 75 x 75 | 100 x 100 | 75 x 75 |
Frame rate (max.) [Hz] | 2,250 (16-bit); 4,500 (8-bit) | 120,000 | 2,250 (16-bit); 4,500 (8-bit) |
| View all specifications | VIEW ALL SPECIFICATIONS | View all specifications |
*All specifications are subject to change without notice.
Key Contact
Techniques
Electron Energy Loss Spectroscopy (EELS)
Simultaneously record the Zero-Loss Peak (ZLP) and the core-loss features that are present in the spectrum with our radiation-hard, high-dynamic-range electron detectors.
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Fast Elemental Mapping
Perform elemental mapping almost in real time, and with minimal radiation damage to your sample, using our extremely fast hybrid-pixel detectors.
Four-Dimensional Scanning Transmission Electron Microscopy (4D STEM)
Collect 4D STEM data of the highest possible quality with our precise and reliable electron-counting detectors.
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Micro-Electron Diffraction (microED)
Acquire high-quality microED data fast using direct electron detection, combined with the high dynamic range and radiation hardness of DECTRIS’ electron detectors.
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We are happy to answer any questions about us, our detectors, or the process of integrating our detectors into your experimental setup.
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