SELUN

Fast, faster, SELUN: Accelerate measurements to 120,000 frames per second with the next generation hybrid photon counting (HPC) X-ray detector. Designed to exploit the high coherent fluxes of 4th-generation synchrotrons, SELUN offers an unparalleled match of sustained frame rate and count rate – full dynamic range, even at maximum speed.

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SELUN

SELUN’s standout feature is the continuous frame rate of 120 kHz with a duty cycle of >98.8%. This can be achieved through on-chip 2x2 pixel binning in combination with a novel in-pixel compression scheme. The detector features a continuous 190x190 pixel matrix with a 100 µm pixel pitch and is compatible with both silicon and highZ sensors to provide optimal quantum efficiency, both at low (8-25 keV) and high (10-80 keV) photon energies.

Its ultra-fast front end with DECTRIS Instant Retrigger® technology enables photon counting at exceptional rates exceeding 4.5 G ph/s/mm², independent of the frame rate: Resolve weak and strong signals simultaneously, with zero noise contribution, single pixel spatial resolution, and maximum detection efficiency.

SELUN is ideal for coherent scattering techniques such as Ptychography, Bragg Coherent Diffraction Imaging (BCDI), and X-ray Photon Correlation Spectroscopy (XPCS), in which fast, precise, and reliable measurements over hours and days are crucial for success. Its user-friendly design uses the same modern SIMPLON API controls and data interface as the widespread EIGER2 and PILATUS4 detector families, ensuring seamless integration. Expect unparalleled speed, dynamic range, and reliability at your beamline with DECTRIS SELUN®.

  • ✓ Fast, continuous frame rates: 120 kHz 2x2 binned, and 30 kHz full readout with a duty cycle of >98.8%.
  • ✓ High dynamic range, even at full speed: 4.5 G ph/s/mm2.
  • ✓ Photon-counting data quality: No readout noise and no dark signal, for an optimal signal-to-noise ratio.
  • ✓ Easy to use, stable & reliable: Proven DECTRIS quality paired with expert-level technical support.

Testimonial

„We tested a prototype of the SELUN detector at beamline P10 of PETRA III performing XPCS in USAXS geometry, and have been impressed not only by the performance of the detector especially with respect to it’s framing rate, but also by the simplicity of the integration into the workflow of the beamline.”

- Fabian Westermeier, P10, DESY

Publications

Detectors

SELUN

SELUN

Next Level Photon Counting for Coherent Scattering Techniques

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SELUN High-Z

SELUN High-Z

Next Level Photon Counting for Coherent Scattering Techniques

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Detector Specifications*

SELUN

SELUN High-Z

Active area (W x H)
[mm²]

19.0 x 19.0

19.0 x 19.0

Pixel array (W x H)

2x2 binned: 94 x 94 Full: 190 x 190

2x2 binned: 94 x 94 Full: 190 x 190

Pixel size (W x H)
[µm²]

2x2 binned: 200 x 200 Full: 100 x 100

2x2 binned: 200 x 200 Full: 100 x 100

Count rate (max.)
[ph/s/pixel]

2x2 binned: 1.8 x 108 Full: 4.5 x 107

2x2 binned: 1.8 x 108 Full: 4.5 x 107

Energy range
[keV]

8 - 30

10 - 40

Threshold range
[keV]

4.6 - 25

5 - 25

Frame rate (max.)
[Hz]

2x2 binned: 120,000 Full: 30,000

2x2 binned: 120,000 Full: 30,000

Readout time

continuous readout, >98.8% duty cycle

continuous readout, >98.8% duty cycle

Image bit depth
[bits]

32, 16

32, 16

Sensor thickness
[µm]

450 (Si)

1,500 (CZT)

Vacuum compatibility

yes

yes

Dimensions (W x H x D)
[mm³]

114 x 92 x 241.5

114 x 92 x 241.5

Weight
[kg]

3.7

3.7

Removable window

yes (optional)

no

FULL TECHNICAL SPECIFICATIONS AND USER DOCUMENTATION

*All specifications are subject to change without notice.

Key Contacts

Tilman Donath

Tilman Donath

Product Manager - High Energy

tilman.donath@dectris.com

Contact Tilman
Sascha Grimm

Sascha Grimm

Product Manager - Synchrotrons

sascha.grimm@dectris.com

Contact Sascha

Related Documents

Techniques

X-ray Ptychography

X-ray Ptychography

X-ray ptychography is a super-resolution method based on Coherent Diffractive Imaging.

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Coherent Diffractive Imaging (CDI)

Coherent Diffractive Imaging (CDI)

This lensless technique provides aberration-free 2D or 3D images of nanoscale structures, but it is not without challenges.

Read more →

Related News

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